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VLSI Testing Course
Complete Course with Simple Explanations
1. Introduction to VLSI Testing
VLSI Testing ensures chips work correctly after fabrication. It detects manufacturing defects and validates functionality.
2. Fault Models
Fault models represent failures:
• Stuck-At Fault
• Transition Fault
• Bridging Fault
• Open Fault
• Delay Fault
3. ATPG (Automatic Test Pattern Generation)
ATPG tools create vectors to detect faults. Tools: TetraMAX, FastScan.
4. Scan Design / DFT Basics
Scan DFFs convert sequential logic to testable form.
5. BIST (Built-In Self Test)
Chip tests itself using LBIST & MBIST.
6. Memory Testing
March C, March X, Checkerboard, Walking 1/0.
7. JTAG Boundary Scan
JTAG used for board-level testing.
8. Delay Testing
Detects slow paths & timing issues.
9. Test Coverage & Quality
Higher coverage → lower defects.
10. ATE (Automatic Test Equipment)
ATE machines like Advantest, Teradyne used for production.
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